New SEM in Electron Microscopy

Related Core Facilities:

Tuesday 08/06/2013

The Electron Microscopy Resource is pleased to announce the arrival of the new JEOL 6610LV scanning electron microscope (SEM).  We received the microscope in January 2013.  This microscope is a high-performance SEM for fast characterization and imaging of fine structures on both small and large samples.  It is equipped with a large specimen chamber and automated specimen stage.  The microscope can be operated in low vacuum mode for observation of non-conductive specimens.  A highly sensitive backscattered detector and low vacuum secondary detector are used for observation of these non-conductive specimens.  It offers a magnification range from 5X to 300,000X and has a resolution of 3.0nm at 30KV in the high vacuum mode.  This instrument is located in the Thomas Building on the E level in room DE-780.

More information on the JEOL 6610LV can be found on the JEOL website.

image description

Shared Resources are core facilities that provide services and access to specialized equipment for research activities.


Rajesh K. Uthamanthil, DVM, PhD, DACLAM

Associate Vice President, Shared Resources